X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2−xO3 (x=0–2) films on Si (111)
发布时间：2025-04-30
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- 发布时间：
- 2025-04-30
- 论文名称：
- X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2−xO3 (x=0–2) films on Si (111)
- 发表刊物：
- Journal of Applied Physics
- 摘要：
- X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite Pr x Y 22x O 3 (x 5 0–2) films on Si (111) Ternary single crystalline bixbyite Pr x Y 2Àx O 3 films over the full stoichiometry range (x ¼ 0–2) have been epitaxially grown on Si (111) with tailored electronic and crystallographic structure. In this work, we present a detailed study of their local atomic environment by extended X-ray absorption fine structure at both Y K and Pr L III edges, in combination with complementary high resolution x-ray diffraction measurements. The local structure exhibits systematic variations as a function of the film composition. The cation coordination in the second and third coordination shells changes with composition and is equal to the average concentration, implying that the Pr x Y 2Àx O 3 films are indeed fully mixed and have a local bixbyite structure with random atomic-scale ordering. A clear deviation from the virtual crystal approximation for the cation-oxygen bond lengths is detected. This demonstrates that the observed Vegard's law for the lattice variation as a function of composition is based microscopically on a more complex scheme related to local structural distortions which accommodate the different cation–oxygen bond lengths.
- 合写作者：
- G Niu · M H Zoellner · P Zaumseil · [...]
- 是否译文：
- 否
- 发表时间：
- 2013-01-28