Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals
发布时间：2025-04-30
点击次数：
- 发布时间：
- 2025-04-30
- 论文名称：
- Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals
- 发表刊物：
- IEEE Transactions on Electron Devices
- 合写作者：
- Zheng Chai; Jigang Ma; Wei Dong Zhang; Bogdan Govoreanu; Jian Fu Zhang; Zhigang Ji; Malgorzata Jurczak
- 卷号：
- Volume: 64, Issue: 10
- 页面范围：
- 4099 - 4105
- 是否译文：
- 否
- 发表时间：
- 2017-08-29