Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM (a-VMCO) by RTN and CVS techniques for memory window improvement
Release Time:2025-04-30
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- Date:
- 2025-04-30
- Title of Paper:
- Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM (a-VMCO) by RTN and CVS techniques for memory window improvement
- Journal:
- 2016 IEEE International Electron Devices Meeting (IEDM)
- Co-author:
- J. Ma; Z. Chai; W. Zhang; B. Govoreanu; J. F. Zhang; Z. Ji; B. Benbakhti; G. Groeseneken; M. Jurczak
- Volume:
- 1
- Translation or Not:
- No
- Date of Publication:
- 2016-12-03
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