RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
Release Time:2025-04-30
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- Date:
- 2025-04-30
- Title of Paper:
- RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
- Journal:
- 2016 IEEE Symposium on VLSI Technology
- Co-author:
- Z. Chai, J. Ma, W. Zhang*, B. Govoreanu, E. Simoen, J. F. Zhang, Z. Ji, R. Gao, G. Groeseneken, M. Jurczak
- Translation or Not:
- No
- Date of Publication:
- 2016-06-14