Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals
Release Time:2025-04-30
Hits:
- Date:
- 2025-04-30
- Title of Paper:
- Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals
- Journal:
- IEEE Transactions on Electron Devices
- Co-author:
- Zheng Chai; Jigang Ma; Wei Dong Zhang; Bogdan Govoreanu; Jian Fu Zhang; Zhigang Ji; Malgorzata Jurczak
- Volume:
- Volume: 64, Issue: 10
- Page Number:
- 4099 - 4105
- Translation or Not:
- No
- Date of Publication:
- 2017-08-29