The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique
Release Time:2025-04-30
Hits:
- Date:
- 2025-04-30
- Title of Paper:
- The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique
- Journal:
- IEEE Electron Device Letters
- Co-author:
- Zheng Chai; Weidong Zhang; Pedro Freitas; Firas Hatem; Jian Fu Zhang; John Marsland; Bogdan Govoreanu; Ludovic Goux; Gouri Sankar Kar; Steve Hall; Paul Chalker; John Robertson
- Volume:
- Volume: 39, Issue: 7
- Page Number:
- 955 - 958
- Translation or Not:
- No
- Date of Publication:
- 2018-05-04