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夏明岗

教授    博士生导师    硕士生导师

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  • 学历: 博士研究生毕业
  • 办公地点: 仲英楼B812
  • 学位: 博士
  • 职称: 教授

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Plasma-induced symmetric ambipolar transport in MoS2/WSe2 p-n heterojunctions via stacking-order-mediation

发布时间:2026-03-23
点击次数:
发布时间:
2026-03-23
影响因子:
3.6
DOI码:
10.1063/5.0313734
论文名称:
Plasma-induced symmetric ambipolar transport in MoS2/WSe2 p-n heterojunctions via stacking-order-mediation
发表刊物:
APPLIED PHYSICS LETTERS
摘要:
Ambipolar semiconductors based on two-dimensional p-n junctions have attracted significant attention and are driving optoelectronic and logic circuit applications. However, their low carrier mobility and electron-hole mobility asymmetry (>10(1)) result in poor signal resolution, which limits its practical applications. This study demonstrates high-mobility and mobility-symmetric ambipolar transport in MoS2/WSe2 p-n heterojunctions through precise oxygen plasma-mediated interface engineering. The mild oxygen plasma treatment simultaneously passivates selenium vacancies in WSe2 and sulfur vacancies in MoS2, thereby reducing scattering centers and optimizing carrier concentrations. The elevated and balanced carrier concentrations on both sides of the junction effectively lower the tunneling barrier, facilitating efficient charge injection and enabling high-performance ambipolar conduction. Analysis of the charge transport mechanism reveals a direct tunneling mode at the heterointerface. By applying a 6 s low-power soft oxygen plasma treatment to MoS2 and a 30 s oxygen plasma to WSe2, the device exhibits a more than two orders of magnitude improvement in electrical performance, demonstrating symmetric ambipolar behavior with a hole mobility of 83 cm(2) V-1 s(-1) and an electron mobility of 42 cm(2) V-1 s(-1), respectively. This work establishes plasma-induced design principles for high-performance ambipolar transistors and provides critical insights for logic optoelectronic devices.
论文类型:
期刊论文
论文编号:
001715550300001
文献类型:
J
卷号:
128
期号:
11
页面范围:
111601
ISSN号:
0003-6951
是否译文:
发表时间:
2026-03-16
收录刊物:
SCI
发布期刊链接:
https://pubs.aip.org/aip/apl/article/128/11/111601/3383685/