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一种测试金属薄膜室温压入蠕变性能的方法
Release Time:
2025-04-30
Hits:
Title:
一种测试金属薄膜室温压入蠕变性能的方法
Type of Patent:
Invent
Application Number:
ZL200510124587.8
Service Invention or Not:
No
Application Date:
2009-01-01
Date:
2025-04-30
Prev One:
具有晶粒尺寸差异的Cu/Ta纳米多层膜的制备方法