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RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
发布时间：2025-04-30
点击次数：
- 发布时间：
- 2025-04-30
- 论文名称：
- RTN-based defect tracking technique: Experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism
- 发表刊物：
- 2016 IEEE Symposium on VLSI Technology
- 合写作者：
- Z. Chai, J. Ma, W. Zhang*, B. Govoreanu, E. Simoen, J. F. Zhang, Z. Ji, R. Gao, G. Groeseneken, M. Jurczak
- 是否译文：
- 否
- 发表时间：
- 2016-06-14
