Characterization of Electro-Thermal Coupling Behaviors and Safe Operating Area of SiC MOSFET Modules in Pulsed Power Applications
Release Time:2025-04-30
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- Date:
- 2025-04-30
- Title of Paper:
- Characterization of Electro-Thermal Coupling Behaviors and Safe Operating Area of SiC MOSFET Modules in Pulsed Power Applications
- Journal:
- IEEE Transactions on Power Electronics
- Co-author:
- Zaojun Ma; Yunqing Pei; Laili Wang; Tongyu Zhang; Haihua Wang; Qingshou Yang
- Translation or Not:
- No
- Date of Publication:
- 2024-06-04