Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy
发布时间：2025-04-30
点击次数：
- 发布时间：
- 2025-04-30
- 论文名称：
- Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy
- 发表刊物：
- Applied Physics Letters
- 摘要：
- All scanning probe microscopies are subjected to topographic cross-talk, meaning the topographyrelated contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BEPFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresis loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.
- 合写作者：
- Sang Mo Yang · Lucie Mazet · M. Baris Okatan · [5th Gang Niu] ·
- 是否译文：
- 否
- 发表时间：
- 2016-06-01