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Experimental Study of Electrical breakdown for Devices with Micrometer Gaps

发布时间:2025-04-30
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发布时间:
2025-04-30
论文名称:
Experimental Study of Electrical breakdown for Devices with Micrometer Gaps
发表刊物:
Plasma Science and Technology
摘要:
合写作者:
MENG Guodong ,CHENG Yonghong ,WU Kai
是否译文:
发表时间:
2014-05-13