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Total dose response of hafnium oxide based metal-oxide-semicondutor structure under gamma-ray irradiation

发布时间:2025-04-30
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发布时间:
2025-04-30
论文名称:
Total dose response of hafnium oxide based metal-oxide-semicondutor structure under gamma-ray irradiation
发表刊物:
IEEE Transactions on Dielectrics and Electrical Insulation
摘要:
合写作者:
Man Ding ,Yonghong Cheng ,Xin Liu,Xiaolong Li
是否译文:
发表时间:
2014-03-16