发布时间：2025-04-30

论文名称：Positive bias and vacuum chamber wall effect on total electron yield measurement: A re-consideration of the sample current method

发表刊物：Journal of Applied Physics

合写作者：Ye Ming; Wang Dan; Li Yun; He Yong Ning; Cui Wan Zhao; Daneshmand Mojgan,

卷号：121(7)

页面范围：074902

是否译文：否

发表时间：2017-02-15