张勇

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Supervisor of Doctorate Candidates

Supervisor of Master's Candidates

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Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

Release Time:2025-04-30
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Date:
2025-04-30
Title of Paper:
Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS
Journal:
Spectroscopy and Spectral Analysis
Summary:
SCI included, 804VE; EI included, EIP20113214216438
Co-author:
Zhang W, Ken J, Zhang Y
Volume:
2011, 31(8)
Page Number:
2081 - 2085
Translation or Not:
No
Date of Publication:
2011-08-01