Interface adhesion and structural characterization of rolled-up GaAs/In0.2Ga0.8As multilayer tubes by coherent phonon spectroscopy
Title of Paper:
Interface adhesion and structural characterization of rolled-up GaAs/In0.2Ga0.8As multilayer tubes by coherent phonon spectroscopy
Co-author:
D. Brick, V. Engemaier, Y. Guo, M. Grossmann, G. Li, D. Grimm, O. Schmidt, M. Schmidt, V. Gusev, M. Hettich, and T. Dekorsy