Intercalation-Induced Interlayer and Defect Engineering in Ti3C2Tx MXene for Ultralow-Reflection Electromagnetic Interference Shielding
Release Time:2025-04-30
Hits:
- Date:
- 2025-04-30
- Title of Paper:
- Intercalation-Induced Interlayer and Defect Engineering in Ti3C2Tx MXene for Ultralow-Reflection Electromagnetic Interference Shielding
- Journal:
- ACS Nano
- Co-author:
- Ruosong Li, Youpeng Huangfu, Lulu Liu, Jiashun Hu, Dan Zeng, Yichen Wang, Daidi Fan, Rui Zhang, and Biao Zhao
- Volume:
- vol. 19, no. 2
- Page Number:
- pp. 2777-2787
- Translation or Not:
- No
- Date of Publication:
- 2025-01-07




