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Microwave reflectometry for imaging diagnosis of internal defects in composite-insulator trunks

Release Time:2025-04-30
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Date:
2025-04-30
Title of Paper:
Microwave reflectometry for imaging diagnosis of internal defects in composite-insulator trunks
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
Summary:
Ruonan Wang, Yong Li, Yang Fang, Qianxiang Gao and Zhenmao Chen, "Microwave reflectometry for imaging diagnosis of internal defects in composite-insulator trunks", IEEE Transactions on Dielectrics and Electrical Insulation, 2025, Accepted.
Co-author:
Ruonan Wang, Yong Li, Yang Fang, Qianxiang Gao and Zhenmao Chen
Translation or Not:
No
Date of Publication:
2025-04-15