Date:

2025-04-30

Title of Paper:

Near- and remote-field pulsed eddy current integrated testing for enhancement in imaging of buried flaws in layered conductive structures

Journal:

Nondestructive Testing and Evaluation

Summary:

Bingjie Su, Yong Li, Zhengshuai Liu, Jin Wang and Zhenmao Chen, "Near- and remote-field pulsed eddy current integrated testing for enhancement in imaging of buried flaws in layered conductive structures", Nondestructive Testing and Evaluation, Vol. 40, No. 8, 2025, pp. 3517-3530.

Co-author:

Bingjie Su, Yong Li, Zhengshuai Liu, Jin Wang and Zhenmao Chen

Translation or Not:

No

Date of Publication:

2025-07-29