Dependence of Charge Accumulation on Sample Thickness in Nano-SiO2 Doped LDPE
Release Time:2025-04-30
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- Date:
- 2025-04-30
- Title of Paper:
- Dependence of Charge Accumulation on Sample Thickness in Nano-SiO2 Doped LDPE
- Journal:
- IEEE Transactions on Dielectrics and Electrical Insulation
- Summary:
- 无
- Co-author:
- Lv, Zepeng，Wang, Xia ， Wu, Kai ，Chen, Xi，Cheng, Yonghong，Dissado, L. A.
- Volume:
- 2013.2.01， 20 （1）
- Page Number:
- 337~345
- Translation or Not:
- No
- Date of Publication:
- 2013-02-01