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刘志远

教授 博士生导师 硕士生导师

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  • 学历: 博士研究生毕业
  • 学位: 博士
  • 职称: 教授
  • 毕业院校: 西安交通大学
  • 学科: 电气工程

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Dielectric recovery behaviors after low current interruption measured by submitcrosecond voltage impulses

发布时间:2025-04-30
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发布时间:
2025-04-30
论文名称:
Dielectric recovery behaviors after low current interruption measured by submitcrosecond voltage impulses
发表刊物:
XXIVth ISDEIV 2010
摘要:
recovery behaviors after current extinction have a decisive influence on the performance of a vacuum circuit breaker (VCB) because it ultimately determines the interruption capacity of the VCB. In order to understand the dielectric recovery behaviors, submicrosecond voltage impulses peaked at 90kV with a rate of rise of ~6 × 108kV/s were applied upon a pair of electrodes in vacuum interrupters. The electrodes were butt type and they were made of Cu and CuCr25,
respectively. The contact diameter was 12mm. The arc current frequency was 50Hz and the arcing time was about 9ms. The results showed that the breakdown voltage in the dielectric recovery processes plateaued between 50kV to 80kV from 10μs to 60 μs after current zero for Cu contact material at peak arc current 1500A    and the breakdown voltage was between 70kV to 90kV for CuCr25 contact material. Moreover, arc current varied from 550A to 2500A (peak value) had no sign ificant effect on the mean breakdown values of Cu and CuCr25 contact materials.
合写作者:
Zhenxing Wang,Yingsan Geng,Peng Yan,Zhiyuan Liu
卷号:
no.5 vol.3
页面范围:
40-43
是否译文:
发表时间:
2010-09-02