EN 登录

刘志远

教授 博士生导师 硕士生导师

个人信息
Personal Information
  • 电子邮箱:
  • 学历: 博士研究生毕业
  • 学位: 博士
  • 职称: 教授
  • 毕业院校: 西安交通大学
  • 学科: 电气工程

论文成果

当前位置: 中文主页 > 科学研究 > 论文成果

Improvement of Reliability of Closing Latch in Spring Type Operating Mechanism of High Voltage Circuit Breakers

发布时间:2025-04-30
点击次数:
发布时间:
2025-04-30
论文名称:
Improvement of Reliability of Closing Latch in Spring Type Operating Mechanism of High Voltage Circuit Breakers
发表刊物:
IEEE POWER AND ENERGY SOCIETY TRANSMISSION
摘要:
Occasionally closing operation failures occurred when a spring type operating mechanism was used to operate a high voltage circuit breaker with higher loads. This kind of failures is a high risk for circuit breakers. The objective of this paper is to propose a concept of reset time difference of a trip-open unit and to improve the reliability
of closing operation of a high  voltage circuit breaker with a spring type operating mechanism based on the reset time
difference. In a spring type operating mechanism, there is a big latch and a small latch in a trip-open latch unit. In a close operation of a high voltage circuit breaker driven by a spring type operating mechanism, there is a time lag
between the big latch and the small latch when they reach their final latched positions. A nd we definite the time lag as the reset time difference (TR). The experimental results showed that the reliability of closing operation can be
guaranteed with TRwas higher than 10ms. And TRincreased with an increase of a preload of the big latch spring. And the bounces of the small latch were the most significant factor to cause a closing operation failure. An improvement from the point of view of time reset difference (TR) enhanced the reliability of  closing operation of a high voltage circuit breaker.
合写作者:
Yu,Xue,Wang,Geng,Liu,Wei,You
卷号:
May 7-10, 2012,
页面范围:
11-14
是否译文:
发表时间:
2012-05-22