基于第二类外尔半金属二碲化钼的光电探测器及其探测方法
- Release Time:2025-04-30
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Title:
基于第二类外尔半金属二碲化钼的光电探测器及其探测方法Disigner of the Invention:
孙栋，赖佳伟，马骏超Type of Patent:
InventApplication Number:
ZL201711256309.7Service Invention or Not:
NoApplication Date:
2017-12-04Date:
2025-04-30
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