一种基于电光效应的表面电荷测量系统
Release Time:2025-04-30
Hits:
- Title:
- 一种基于电光效应的表面电荷测量系统
- Type of Patent:
- Invent
- Application Number:
- 2009100234569
- Service Invention or Not:
- No
- Application Date:
- 2009-07-28
- Date:
- 2025-04-30
- Prev One:一种用于电介质微弱发光测量的单光子计数系统
- Next One:一种金属氧化物避雷器在线监测装置