Patents
Release Time: 2025-04-30Hits:
  • Title:基于射线衰减能量场的无损检测缺陷提取、识别方法
  • Disigner of the Invention:高建民，陈富民等
  • Type of Patent:Invent
  • Application Number:ZL2007 1 0018884.3
  • Service Invention or Not:No
  • Application Date:2011-06-22
  • Date:2025-04-30

高建民
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