Papers
Release Time: 2025-04-30Hits:
- Date:2025-04-30
- Title of Paper:Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias
- Journal:Physical Review B
- Summary:The effective barrier height between an electrode and a ferroelectric (FE) depends on both macroscopic electrical properties and microscopic chemical and electronic structure. The behavior of a prototypical electrode/FE/electrode structure, Pt/BaTiO3/Nb-doped SrTiO3, under in-situ bias voltage is investigated using X-Ray Photoelectron Spectroscopy. The full band alignment is measured and is supported by transport measurements. Barrier heights depend on interface chemistry and on the FE polarization. A differential response of the core levels to applied bias as a function of the polarization state is observed, consistent with Callen charge variations near the interface.
- Co-author:J. E. Rault · G. Agnus · T. Maroutian · [6th Gang Niu] ·
- Translation or Not:No
- Date of Publication:2013-02-19
