Phase-modulation combined deflectometry for small defect detection
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发布时间：2026-04-09
发布时间：2026-04-09
影响因子：1.7
DOI码：10.1364/AO.382104
论文名称：Phase-modulation combined deflectometry for small defect detection
教研室：新能源装备与质量工程研究所
发表刊物：Applied Optics
刊物所在地：美国
项目来源：National Key R&D Program of China (2017YFF0210500)
摘要：Deflectometry has been widely used to detect defects on specular surfaces. However, it is still very challenging to detect defects on semispecular or diffuse surfaces because of the low contrast and low signal-to-noise ratio. To address this challenge, we proposed a phase-modulation combined method for accurate defect detection. Based on the phase and modulation of captured fringes, a dual-branch convolutional neural network is employed to simultaneously extract geometric and photometric features from the phase-shifting pattern sequence and modulation, which improves the defect detection performance significantly. Compared to state-of-the-art methods, we believe the results demonstrated the proposed method’s effectiveness and capability to reduce false positives.
合写作者：黄军辉,段琼琼,邢超,高建民
第一作者：齐召帅
论文类型：期刊论文
通讯作者：王昭
学科门类：工学
一级学科：机械工程
文献类型：J
卷号：59
期号：7
页面范围：2016-2023
是否译文：否
发表时间：2020-02-25
收录刊物：SCI
发布期刊链接：https://opg.optica.org/ao/fulltext.cfm?uri=ao-59-7-2016