Total Dose Response of Hafnium Oxide based Metal-Oxide-Semiconductor Structure under Gamma-ray Irradiation
Release Time:2025-04-30
Hits:
- Date:
- 2025-04-30
- Title of Paper:
- Total Dose Response of Hafnium Oxide based Metal-Oxide-Semiconductor Structure under Gamma-ray Irradiation
- Journal:
- IEEE Transactions on Dielectrics and Electrical Insulation
- Summary:
- 略
- Co-author:
- Ding, Man ，Cheng, Yonghong ，Liu, Xin，Li, Xiaolong
- Translation or Not:
- No
- Date of Publication:
- 2014-06-23