发布时间：2025-04-30

论文名称：[51] Fast simulation of ECT signal due to a conductive crack of arbitrary width, Vol.42, 683-686

发表刊物：IEEE Trans. Mag.

摘要：Zhenmao Chen, M.Rebican, N.Yusa and K.Miya, Fast simulation of ECT signal due to a conductive crack of arbitrary width, IEEE Trans. Mag., Vol.42,  683-686, 2006, (030ZZ).

合写作者：Zhenmao Chen, M.Rebican, N.Yusa...

卷号：Vol.42, 683-686, 2006

是否译文：否

发表时间：2006-10-04