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基于阵列激光源的结构表面裂纹红外无损检测及成像方法

Release Time:2025-04-30
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Title:
基于阵列激光源的结构表面裂纹红外无损检测及成像方法
Disigner of the Invention:
裴翠祥,陈振茂,蔡文路,杨桂才
Type of Patent:
Invent
Application Number:
201410787271.6
Service Invention or Not:
No
Application Date:
2014-12-01
Date:
2025-04-30