Date:

2025-04-30

Title of Paper:

[51] Fast simulation of ECT signal due to a conductive crack of arbitrary width, Vol.42, 683-686

Journal:

IEEE Trans. Mag.

Summary:

Zhenmao Chen, M.Rebican, N.Yusa and K.Miya, Fast simulation of ECT signal due to a conductive crack of arbitrary width, IEEE Trans. Mag., Vol.42,  683-686, 2006, (030ZZ).

Co-author:

Zhenmao Chen, M.Rebican, N.Yusa...

Volume:

Vol.42, 683-686, 2006

Translation or Not:

No

Date of Publication:

2006-10-04