Login 中文
Personal Profile
To be updated...
王丹
副教授
Papers
A new method for measuring total electron emission yield of insulators
Release Time:2025-04-30 Hits:
Date:
2025-04-30
Title of Paper:
A new method for measuring total electron emission yield of insulators
Journal:
Review of Scientific Instruments
Co-author:
Cai, Yahui; Wang, Dan; Ye, Ming; He, Yongning
Volume:
91(9)
Page Number:
095111
Translation or Not:
No
Date of Publication:
2020-09-18

Prev One:Investigation on secondary electron emission characteristics of double-layer structures

Next One:Theoretical and experimental investigation of secondary electron emission characteristics of MgO coating produced by atomic layer deposition