Positive bias and vacuum chamber wall effect on total electron yield measurement: A re-consideration of the sample current method
Title of Paper:
Positive bias and vacuum chamber wall effect on total electron yield measurement: A re-consideration of the sample current method
Journal:
Journal of Applied Physics
Co-author:
Ye Ming; Wang Dan; Li Yun; He Yong Ning; Cui Wan Zhao; Daneshmand Mojgan,
Papers
